The all-digital 5120A High-Performance Phase Noise and Allan Deviation (ADEV) Test Set with Ultra Low Noise Floor transforms the way accurate phase noise and Allan deviation measurements are made. This simple one-box solution makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions. What used to be complicated and costly are now easier, more accurate, and more cost effective.
The 5120A leverages the extensive knowledge and experience obtained by Microsemi during the development of the industry standard for ADEV measurements, the 5110A. With a frequency range of 1 - 30MHz, the next generation 5120A also provides phase noise measurement accuracy down to previously impossible levels of ±1.0 dB.
The innovative 5120A combines sophisticated timing technologies into a single advanced instrument, which integrates all required measurement functionality into a one box solution, requiring no calibration or configuration.
Since all configuration and calibration is done by the 5120A, extremely accurate measurements are made without a highly trained engineer having to oversee these measurements. To begin making measurements simply connect the device under test and reference (which is optional with the 5120A-01) to the 5120A and press the green Start button. Within seconds results are presented on the high resolution, real-time display.
The one box test solution with an integrated low noise internal reference oscillator, known as the 5120A-01, enables accurate measurements without an external reference. Previously, customers needed to provide a low noise reference at the exact test frequency which was time consuming and costly. Now, after making just one connection from the DUT to the 5120A-01, you can begin making accurate measurements. Capable of measuring down to -168 dBc/Hz, the 5120A-01 meets even the highest performance requirements.
The 5120A is the most accurate phase noise and ADEV test set in the industry. The National Institute of Standards and Technology (NIST) calibrated a sample 5120A and confirmed its accuracy to be better than ±1.0 dB, the best in the industry. At
The 5120A''s all-digital design supports the widest range of phase noise and ADEV measurements of any commercially available product. The patented all-digital design in the 5120A enables phase noise measurements, to be without carrier suppression, which allows measurements below 0.1 mHz. This same technology makes ADEV measurements to over 300 days possible.
Unlike traditional measurement systems, the 5120A does not require that the frequency of the reference be the same as the DUT, thus allowing accurate measurements to be made on a DUT at any frequency, with a single low noise reference.
The 5120A meets the needs of applications requiring printing or further data analysis. The front panel Print button allows direct printing. When further data analysis is required, measurement data from the 5120A can be easily imported into industry standard software for frequency stability analysis, like Stable32.